| 2022-05-20 01:46:56 |
Primary Contact: Name |
Silvia Russo |
Silvia Russi |
| 2020-02-12 05:48:26 |
Energy Range (keV): Min |
7.0 |
7.1 |
| 2020-02-12 05:48:14 |
Wavelength (Å): Max |
1.76 |
1.75 |
| 2020-02-12 05:47:52 |
Flux Details |
Flux measured through a 0.2 x 0.2 mm2 aperture at 11.0 keV and 500 mA |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12.0 keV and 500 mA |
| 2020-02-12 05:47:23 |
Flux Details |
Flux measured through a 0.2x0.2 mm2 aperture at 11.0 keV and 500 mA |
Flux measured through a 0.2 x 0.2 mm2 aperture at 11.0 keV and 500 mA |
| 2020-02-12 05:47:07 |
Flux Coefficient |
3 |
2 |
| 2020-02-12 05:46:44 |
Monochromator |
Side scattering I-beam bent single crystal; asymmetric cut 4.9650 deg. |
Side scattering I-beam bent single crystal |
| 2020-02-12 05:44:26 |
Special Capabilities |
Room Temperature |
Absorption Edges, Automatic Crystal Alignment, Automated Sample Screening, High Resolution, High Temperature, Humidity Control |
| 2020-02-12 05:43:38 |
Special Capabilities |
High Throughput |
Room Temperature |
| 2020-02-12 05:42:16 |
Special Capabilities |
Absorption Edges, Automatic Crystal Alignment, Automated Sample Screening, High Resolution, High Throughput |
High Throughput |
| 2020-02-12 05:41:53 |
Status Details |
|
Development |
| 2020-02-12 05:41:26 |
Secondary Contact: Email |
ana@slac.stanford.edu |
soltis@slac.stanford.edu |
| 2020-02-12 05:41:11 |
Secondary Contact: Name |
Ana Gonzalez |
Mike Soltis |
| 2020-02-12 05:40:59 |
Primary Contact: Email |
soltis@slac.stanford.edu |
srussi@slac.stanford.edu |
| 2020-02-12 05:40:33 |
Primary Contact: Name |
Michael Soltis |
Silvia Russo |
| 2017-12-07 08:06:31 |
Flux Exponent |
11 |
10 |
| 2017-12-07 08:06:14 |
Flux Coefficient |
1.8 |
3 |
| 2015-11-24 05:58:46 |
Flux Coefficient |
3.9 |
1.8 |
| 2014-09-30 10:37:13 |
Services |
High quality data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
High quality data collection, Processing, Rapid access, Structure refinement, Structure solution, On-site crystallization facility |
| 2014-09-30 10:35:30 |
Source Details |
8 pole wiggler |
20 pole wiggler |
| 2014-09-30 04:12:05 |
Detector: Details |
Sample to detector distance: 107 to 650 mm; Maximum vertical offset: 75 mm |
|
| 2014-09-30 02:52:01 |
Lab Facilities |
Biochemical lab with cold room |
Biochemical lab with cold room; P2 biohazard |
| 2014-09-30 02:22:59 |
Special Capabilities |
Absorption Edges, Automatic Crystal Alignment, Automated Sample Screening, High Resolution, High Throughput, Visex microscope |
Absorption Edges, Automatic Crystal Alignment, Automated Sample Screening, High Resolution, High Throughput |
| 2014-09-30 02:22:01 |
Special Capabilities |
Absorption Edges, Automated Sample Screening, High Resolution |
Absorption Edges, Automatic Crystal Alignment, Automated Sample Screening, High Resolution, High Throughput, Visex microscope |
| 2014-09-30 02:20:44 |
Services |
High quality data collection, On-site cyrstallization facility, Rapid access, Structure refinement, Structure solution |
High quality data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
| 2014-09-30 02:04:08 |
Flux Details |
Flux measured through a 0.2x0.2 mm2 aperture at 11.0 keV and 500 mA SPEAR current |
Flux measured through a 0.2x0.2 mm2 aperture at 11.0 keV and 500 mA |
| 2014-09-30 02:03:48 |
Mirrors |
Rh coated flat mirror. |
Rh coated focusing mirror |
| 2014-09-30 02:02:11 |
Special Capabilities |
High Resolution |
Absorption Edges, Automated Sample Screening, High Resolution |
| 2014-09-30 02:01:54 |
Special Capabilities |
Absorption Edges, Automated Sample Screening, High Resolution |
High Resolution |
| 2014-09-30 02:00:41 |
Special Capabilities |
Absorption Edges, Automated Sample Screening, High Resolution |
Absorption Edges, Automated Sample Screening, High Resolution |
| 2014-09-30 01:59:18 |
Services |
Data collection, High quality data collection, High speed data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
High quality data collection, On-site cyrstallization facility, Rapid access, Structure refinement, Structure solution |
| 2014-09-30 01:58:14 |
Special Capabilities |
High Resolution |
Absorption Edges, Automated Sample Screening, High Resolution |
| 2014-09-30 01:56:26 |
Special Capabilities |
Absorption Edges, Automated Sample Screening, High Temperature |
High Resolution |
| 2013-07-17 07:35:07 |
Special Capabilities |
Visex microscope |
Absorption Edges, Automated Sample Screening, High Temperature |
| 2013-07-17 07:34:50 |
Special Capabilities |
Absorption Edges, Automated Sample Screening, High Intensity, High Resolution, High Temperature |
Visex microscope |
| 2013-07-17 07:32:07 |
Special Capabilities |
Visex microscope |
Absorption Edges, Automated Sample Screening, High Intensity, High Resolution, High Temperature |
| 2013-07-17 07:29:57 |
Special Capabilities |
Automated Sample Screening, High Intensity |
Visex microscope |
| 2013-07-17 07:29:06 |
Special Capabilities |
Automated Sample Screening |
Automated Sample Screening, High Intensity |
| 2013-07-17 07:28:58 |
Special Capabilities |
Visex microscope |
Automated Sample Screening |
| 2013-07-17 07:27:00 |
Special Capabilities |
Absorption Edges, Automated Sample Screening, High Throughput |
Visex microscope |
| 2013-07-17 07:25:54 |
Goniometer Details |
Maximum kappa offset: 35 degrees |
|
| 2013-07-17 07:24:30 |
Flux Details |
Flux measured through a 0.2x0.2 mm2 aperture at 12.6 keV and 350 mA SPEAR current |
Flux measured through a 0.2x0.2 mm2 aperture at 11.0 keV and 500 mA SPEAR current |
| 2013-07-17 07:24:00 |
Flux Coefficient |
2.4 |
3.9 |
| 2013-07-17 07:23:42 |
Spot Size (mm): Width |
2.0 |
0.1-0.25 |
| 2013-07-17 07:23:28 |
Spot Size (mm): Height |
0.3 |
0.1-0.2 |
| 2012-03-19 05:07:45 |
Detector: Details |
Sample to detector distance: 107 to 650 mm; Maximum vertical offset: 75mm |
Sample to detector distance: 107 to 650 mm; Maximum vertical offset: 75 mm |
| 2012-03-19 05:07:01 |
Flux Details |
Flux measured through a 0.2x0.2 mm2 aperture at 12.6keV and 350mA SPEAR current |
Flux measured through a 0.2x0.2 mm2 aperture at 12.6 keV and 350 mA SPEAR current |
| 2012-03-19 05:06:35 |
Monochromator |
side scattering I-beam bent single crystal; asymmetric cut 4.9650 deg. |
Side scattering I-beam bent single crystal; asymmetric cut 4.9650 deg. |
| 2012-03-19 04:34:35 |
Services |
Data collection |
Data collection, High quality data collection, High speed data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
| 2012-03-19 04:34:04 |
Services |
Data collection |
Data collection |
| 2012-03-19 04:33:54 |
Services |
Structure solution |
Data collection |
| 2012-03-19 04:33:39 |
Services |
Data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
Structure solution |
| 2011-11-18 07:54:35 |
Flux Coefficient |
2.2 |
2.4 |
| 2011-11-18 07:54:24 |
Spot Size (mm): Height |
0.2 |
0.3 |
| 2010-11-16 08:19:02 |
Detector: Details |
Sample to detector distance: 100 to 650 mm; Maximum vertical offset: 75mm |
Sample to detector distance: 107 to 650 mm; Maximum vertical offset: 75mm |
| 2010-11-16 08:16:28 |
Flux Details |
Flux measured through a 0.2x0.2 mm2 aperture at 12.6keV and 200mA SPEAR current |
Flux measured through a 0.2x0.2 mm2 aperture at 12.6keV and 350mA SPEAR current |
| 2010-11-16 08:16:01 |
Spot Size (mm): Width |
1.9 |
2.0 |
| 2010-11-16 08:15:53 |
Spot Size (mm): Height |
0.25 |
0.2 |
| 2009-11-18 03:00:31 |
Cryo Capability Details |
|
100K - room tempareature |
| 2009-11-18 02:59:57 |
Detector: Details |
|
Sample to detector distance: 100 to 650 mm; Maximum vertical offset: 75mm |
| 2009-11-18 02:59:31 |
Detector: Model |
ADSC QUANTUM 315r |
ADSC Quantum 315r |
| 2009-11-18 02:59:21 |
Robotics: More Info |
|
See http://smb.slac.stanford.edu/users_guide/ |
| 2009-11-18 02:58:54 |
Goniometer Details |
|
Maximum kappa offset: 35 degrees |
| 2009-11-18 02:57:33 |
Flux Details |
Flux measured through a 0.2x0.2 mm2 aperture at 90mA SPEAR current |
Flux measured through a 0.2x0.2 mm2 aperture at 12.6keV and 200mA SPEAR current |
| 2009-11-18 02:57:17 |
Flux Exponent |
0.3e11 at 7.0keV; 1.2e11 at 10.0keV; 1.4e11 at 12.7keV |
11 |
| 2009-11-18 02:57:09 |
Flux Coefficient |
|
2.2 |
| 2009-11-18 02:56:33 |
Spot Size (mm): Width |
1.7 |
1.9 |
| 2009-11-18 02:56:28 |
Spot Size (mm): Height |
0.2 |
0.25 |
| 2009-11-18 02:55:50 |
Source Type |
bending magnet |
INSERTION DEVICE |
| 2009-11-18 02:55:42 |
Services |
|
Data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
| 2009-11-18 02:55:24 |
Special Capabilities Details |
|
Full remote access |
| 2009-11-18 02:55:13 |
Special Capabilities |
Absorption Edges |
Absorption Edges, Automated Sample Screening, High Throughput |
| 2009-11-18 02:54:59 |
Experiments Details |
|
|
| 2009-11-18 02:54:45 |
Experiments |
SAD, MAD |
MAD, SAD, MONOCHROMATIC |
| 2009-11-18 02:54:29 |
Status |
Since February 2007 |
Operational |
