| 2023-08-11 10:45:50 |
Removed from Service: Details |
|
Currently in use |
| 2023-08-11 10:45:44 |
Detector: Removed from Service |
2015-10-01 |
2032-10-01 |
| 2022-05-20 01:47:33 |
Primary Contact: Name |
Silvia Russo |
Silvia Russi |
| 2020-02-12 05:59:38 |
Flux Details |
Flux measured at 12.6 keV through a 0.2mmx0.2mm aperture and 500 mA |
Flux measured at 12.6 keV through a 0.2 mm x 0.2 mm aperture and 500 mA |
| 2020-02-12 05:59:27 |
Flux Coefficient |
8 |
7 |
| 2020-02-12 05:59:01 |
Crystal Type |
Si(111). A second set of Si (220) crystaks is also available. |
Si(111) |
| 2020-02-12 05:57:43 |
Primary Contact: Email |
soltis@slac.stanford.edu |
srussi@slac.stanford.edu |
| 2020-02-12 05:56:51 |
Primary Contact: Name |
Michael Soltis |
Silvia Russo |
| 2020-02-12 05:56:41 |
Secondary Contact: Name |
Ana Gonzalez |
Mike Soltis |
| 2020-02-12 05:56:23 |
Secondary Contact: Email |
ana@slac.stanford.edu |
soltis@slac.stanford.edu |
| 2017-10-20 09:42:06 |
Spot Size (mm): Width |
0.08-0.2 |
0.1-0.2 |
| 2017-10-20 09:42:00 |
Spot Size (mm): Height |
0.05-0.15 |
0.06-0.08 |
| 2017-01-24 03:39:46 |
Detector: Model |
DECTRIS PILATUS 6M |
MARmosaic 325 |
| 2017-01-24 03:27:31 |
Detector: Type |
CCD |
CCD |
| 2017-01-24 03:27:05 |
Detector: Removed from Service |
|
2015-10-01 |
| 2017-01-24 03:26:37 |
Detector: Type |
PIXEL |
CCD |
| 2017-01-24 03:26:11 |
Detector: Activated for Service |
info currently not available |
2015-10-01 |
| 2017-01-24 03:25:49 |
Detector: Model |
MARmosaic 325 |
DECTRIS PILATUS 6M |
| 2017-01-24 03:25:42 |
Detector: Type |
CCD |
PIXEL |
| 2016-11-14 08:15:42 |
Detector: Removed from Service |
2016-10-01 |
2015-10-01 |
| 2016-11-14 08:15:25 |
Detector: Removed from Service |
2015-10-01 |
2016-10-01 |
| 2016-11-01 02:16:37 |
Flux Coefficient |
4 |
8 |
| 2016-11-01 02:16:23 |
Spot Size (mm): Height |
0.05-0.2 |
0.05-0.15 |
| 2016-11-01 02:16:08 |
Spot Size (mm): Width |
0.05-0.2 |
0.08-0.2 |
| 2016-02-02 05:44:08 |
Flux Coefficient |
2.6 |
4 |
| 2016-02-02 05:42:42 |
Goniometer |
Huber Kappa-geometry goniometer |
SSRL single-axis microdiffractometer |
| 2016-02-02 05:41:27 |
Status Details |
Commission |
|
| 2016-02-02 05:41:17 |
Status |
Undergoing upgrade |
Operational |
| 2016-01-18 07:39:44 |
Flux Details |
Flux measured at 12.6 keV through a 0.2x0.2 aperture and 500 mA |
Flux measured at 12.6 keV through a 0.2mmx0.2mm aperture and 500 mA |
| 2016-01-18 07:39:13 |
Flux Details |
Flux measured at 12.6 keV and 500 mA |
Flux measured at 12.6 keV through a 0.2x0.2 aperture and 500 mA |
| 2016-01-18 07:38:47 |
Energy Range (keV): Max |
14.4 |
14.0 |
| 2016-01-18 07:38:39 |
Wavelength (Å): Min |
0.85 |
0.86 |
| 2016-01-18 07:38:32 |
Flux Coefficient |
7 |
2.6 |
| 2015-10-22 04:49:47 |
Detector: Removed from Service |
|
2015-10-01 |
| 2015-10-22 04:49:41 |
Detector: Model |
DECTRIS PILATUS 6M |
MARmosaic 325 |
| 2015-10-22 04:49:34 |
Detector: Type |
PIXEL |
CCD |
| 2015-10-22 04:44:36 |
Status Details |
The focusing mirror is being replaced |
Commission |
| 2015-10-22 04:43:55 |
Detector: Model |
MARmosaic 325 |
DECTRIS PILATUS 6M |
| 2015-10-22 04:43:44 |
Detector: Type |
CCD |
PIXEL |
| 2014-09-30 10:39:24 |
Services |
High quality data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
High quality data collection, Processing, Rapid access, Structure refinement, Structure solution, On-site crystallization facility |
| 2014-09-30 08:12:43 |
Wavelength (Å): Max |
2.07 |
2.06 |
| 2014-09-30 03:53:58 |
Robotics: More Info |
See http://smb.slac.stanford.edu/users_guide |
See http://smb.slac.stanford.edu/users_guide |
| 2014-09-30 03:53:32 |
Sample Handling: Manual |
|
|
| 2014-09-30 03:53:13 |
Crystal Type |
Si(111). A second set of Si (220) crystaks is also available. |
Si(111). A second set of Si (220) crystaks is also available. |
| 2014-09-30 03:52:38 |
Goniometer Details |
Air bearing; coaxial cold stream; 1.5 micron SOC |
|
| 2014-09-30 03:40:45 |
Monochromator |
Liquid nitrogen-cooled double crystal monochromator |
Liquid nitrogen-cooled double crystal monochromator, non fixed exit slit |
| 2014-09-30 02:50:15 |
Cryo Capability Details |
100K - room temperature |
100k - room temperature |
| 2014-09-30 02:50:01 |
Lab Facilities |
Biochemical lab with cold room; P2 biohazard |
Biochemical lab with cold room; P2 biohazard |
| 2014-09-30 02:48:55 |
Lab Facilities |
Biochemical lab with cold room |
Biochemical lab with cold room; P2 biohazard |
| 2014-09-30 02:44:19 |
Robotics: More Info |
See http://smb.slac.stanford.edu/users_guide |
See http://smb.slac.stanford.edu/users_guide |
| 2014-09-30 02:43:46 |
Sample Handling: Manual |
|
|
| 2014-09-30 02:43:38 |
Goniometer Details |
|
Air bearing; coaxial cold stream; 1.5 micron SOC |
| 2014-09-30 02:43:10 |
Flux Details |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12.6 keV and 350 mA |
Flux measured at 12.6 keV and 500 mA |
| 2014-09-30 02:42:05 |
Optics Details |
|
|
| 2014-09-30 02:41:58 |
Mirrors |
Rh coated collimating mirror, Toroidal focusing mirror |
Rh coated collimating mirror, K-B focusing mirrors |
| 2014-09-30 02:41:16 |
Crystal Type |
Si(111). A second set of Si(220) crystals is also available. |
Si(111). A second set of Si (220) crystaks is also available. |
| 2014-09-30 02:40:29 |
Monochromator |
Liquid nitrogen-cooled double crystal monochromator |
Liquid nitrogen-cooled double crystal monochromator |
| 2014-09-30 02:40:17 |
Monochromator |
Liquid nitrogen double crystal monochromator |
Liquid nitrogen-cooled double crystal monochromator |
| 2014-09-30 02:40:04 |
Monochromator |
Double crystal monochromator |
Liquid nitrogen double crystal monochromator |
| 2014-09-30 02:24:34 |
Special Capabilities |
Absorption Edges, Automated Sample Screening, High Resolution, Microspectrophotometer |
Absorption Edges, Automatic Crystal Alignment, Automated Sample Screening, High Resolution, High Throughput, Microspectrophotometer |
| 2014-09-30 02:19:34 |
Services |
High quality data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
High quality data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
| 2014-09-30 02:18:06 |
Detector: Details |
Sample to detector distance: 100 to 650 mm; Maximum vertical offset: 200mm |
|
| 2014-09-30 02:17:39 |
Goniometer Details |
Maximum kappa offset: 30 degrees |
|
| 2014-09-30 02:17:11 |
Flux Details |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12.6 keV and 500 mA |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12.6 keV and 350 mA |
| 2014-09-30 02:16:35 |
Mirrors |
Rh coated flat mirror, Toroidal focusing mirror |
Rh coated collimating mirror, Toroidal focusing mirror |
| 2014-09-30 02:16:03 |
Spot Size (mm): Width |
0.755 |
0.05-0.2 |
| 2014-09-30 02:15:54 |
Spot Size (mm): Height |
0.130 |
0.05-0.2 |
| 2014-09-30 02:15:18 |
Services |
High quality data collection, On-site cyrstallization facility, Rapid access, Structure refinement, Structure solution |
High quality data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
| 2014-09-30 02:14:31 |
Services |
High quality data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
High quality data collection, On-site cyrstallization facility, Rapid access, Structure refinement, Structure solution |
| 2014-09-30 02:13:51 |
Special Capabilities Details |
Full remote access |
Full remote access |
| 2014-09-30 02:13:28 |
Special Capabilities Details |
|
Full remote access |
| 2014-09-30 02:13:15 |
Special Capabilities |
Microspectrophotometer |
Absorption Edges, Automated Sample Screening, High Resolution, Microspectrophotometer |
| 2014-09-30 02:12:34 |
Special Capabilities |
Absorption Edges, Automated Sample Screening, High Resolution, High Throughput, Full remote access |
Microspectrophotometer |
| 2014-09-30 02:11:32 |
Status Details |
Flat mirror is being replaced |
The focusing mirror is being replaced |
| 2014-09-29 02:03:15 |
Status Details |
|
Flat mirror is being replaced |
| 2014-09-29 01:51:44 |
Mirrors |
Rh coated flat mirror, toroidal focusing mirror |
Rh coated flat mirror, Toroidal focusing mirror |
| 2014-09-29 01:35:02 |
Status |
Operational |
Undergoing upgrade |
| 2014-01-17 09:56:22 |
Energy Range (keV): Max |
14.5 |
14.4 |
| 2014-01-17 09:56:00 |
Flux Details |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12.6 keV and 350 mA |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12.6 keV and 500 mA |
| 2014-01-17 09:55:49 |
Flux Exponent |
12 |
11 |
| 2014-01-17 09:55:44 |
Flux Coefficient |
1 |
7 |
| 2014-01-17 09:55:32 |
Spot Size (mm): Width |
0.55 |
0.755 |
| 2014-01-17 09:55:25 |
Spot Size (mm): Height |
0.10 |
0.130 |
| 2012-03-19 05:15:19 |
Status |
operational |
Operational |
| 2012-03-19 05:11:43 |
Flux Details |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12658 eV and 350 mA current |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12.6 keV and 350 mA |
| 2012-03-19 05:11:27 |
Flux Coefficient |
1.1 |
1 |
| 2012-03-19 05:11:16 |
Spot Size (mm): Height |
0.1 |
0.10 |
| 2011-11-30 10:31:17 |
Spot Size (mm): Height |
0.14 |
0.1 |
| 2010-11-16 08:18:01 |
Flux Details |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12658 eV and 200 mA current |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12658 eV and 350 mA current |
| 2010-11-16 08:17:50 |
Flux Exponent |
11 |
12 |
| 2010-11-16 08:17:45 |
Flux Coefficient |
6.3 |
1.1 |
| 2010-11-16 08:17:32 |
Spot Size (mm): Width |
0.2 |
0.55 |
| 2010-11-16 08:17:25 |
Spot Size (mm): Height |
0.6 |
0.14 |
| 2009-11-18 02:53:54 |
Cryo Capability Details |
|
100K - room temperature |
| 2009-11-18 02:53:24 |
Detector: Details |
|
Sample to detector distance: 100 to 650 mm; Maximum vertical offset: 200mm |
| 2009-11-18 02:52:07 |
Detector: Model |
MARMOSAIC 325 |
MARmosaic 325 |
| 2009-11-18 02:51:55 |
Robotics: More Info |
|
See http://smb.slac.stanford.edu/users_guide |
| 2009-11-18 02:51:28 |
Goniometer Details |
|
Maximum kappa offset: 30 degrees |
| 2009-11-18 02:48:46 |
Flux Details |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12658 eV |
Flux measured through a 0.2 x 0.2 mm2 aperture at 12658 eV and 200 mA current |
| 2009-11-18 02:48:33 |
Flux Coefficient |
5.0 |
6.3 |
| 2009-11-18 02:48:02 |
Mirrors |
Rh coated |
Rh coated flat mirror, toroidal focusing mirror |
| 2009-11-18 02:47:34 |
Spot Size (mm): Width |
0.21 |
0.2 |
| 2009-11-18 02:47:27 |
Spot Size (mm): Height |
0.6 |
0.6 |
| 2009-11-18 02:47:03 |
Source Type |
bending magnet |
INSERTION DEVICE |
| 2009-11-18 02:46:55 |
Services |
High quality data collection, Rapid access |
High quality data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
| 2009-11-18 02:46:15 |
Experiments |
MAD, SAD |
MAD, SAD, MONOCHROMATIC |
| 2009-08-04 05:31:42 |
Services |
Data collection |
High quality data collection, Rapid access |
| 2009-08-04 05:30:47 |
Special Capabilities |
Absorption Edges, Automated Sample Screening, High Resolution, High Throughput |
Absorption Edges, Automated Sample Screening, High Resolution, High Throughput, Full remote access |
| 2009-08-04 05:30:00 |
Special Capabilities Details |
Full remote access |
|
| 2009-08-04 05:29:38 |
Special Capabilities |
Microspectrophotometer (on request) |
Absorption Edges, Automated Sample Screening, High Resolution, High Throughput |
| 2009-08-04 05:28:55 |
Special Capabilities |
Automated Sample Screening |
Microspectrophotometer (on request) |
| 2009-08-04 02:16:45 |
Special Capabilities Details |
Full remote access |
Full remote access |
| 2009-08-04 02:03:38 |
Services |
Data collection |
Data collection |
| 2009-08-04 02:03:35 |
Services |
|
Data collection |
| 2009-08-04 02:03:21 |
Special Capabilities Details |
full remote access |
Full remote access |
| 2009-08-04 02:03:04 |
Special Capabilities |
Automated Sample Screening |
Automated Sample Screening |
| 2009-08-04 02:02:10 |
Special Capabilities |
Automated Sample Screening |
Automated Sample Screening |
| 2009-08-04 02:01:51 |
Special Capabilities |
Absorption Edges |
Automated Sample Screening |
| 2009-08-04 02:01:43 |
Special Capabilities |
null |
Absorption Edges |
| 2009-08-04 01:58:17 |
Special Capabilities Details |
|
full remote access |
