| 2017-02-11 10:45:19 |
Beamline Website |
http://www.psi.ch/sls/pxiii/pxiii |
http://www.psi.ch/sls/pxiii |
| 2017-02-11 10:45:15 |
Secondary Contact: Name |
Vincent Olieric |
Justyna Wojdyla |
| 2017-02-11 10:44:49 |
Secondary Contact: Email |
vincent.olieric@psi.ch |
justyna.wojdyla@psi.ch |
| 2017-02-11 10:44:11 |
Primary Contact: Email |
meitian.wang@psi.ch |
vincent.olieric@psi.ch |
| 2017-02-11 10:44:05 |
Primary Contact: Name |
Meitian Wang |
Vincent Olieric |
| 2017-01-12 04:57:18 |
%Time Available (general use) |
60 |
70 |
| 2017-01-12 04:56:53 |
Cryo Capability Details |
|
fast cooling (5 min) |
| 2017-01-12 04:50:57 |
Experiments |
SAD |
MAD |
| 2017-01-12 04:50:36 |
Experiments |
MAD |
SAD |
| 2017-01-12 04:49:25 |
Special Capabilities Details |
Automated in-situ diffraction screening with crystals in various format of crystallization plates |
Automated in-situ diffraction screening with various SBS crystallization plates format |
| 2017-01-12 04:15:36 |
Goniometer Details |
|
PRIGo |
| 2017-01-12 04:15:32 |
Goniometer |
single phi axis, multi-axis goniometer under commissioning (PRIGO) |
Multi-axis goniometer |
| 2017-01-12 04:14:50 |
Flux Details |
at 400 ma |
at 400 mA |
| 2017-01-12 04:14:19 |
Special Capabilities |
In-situ diffraction screening |
Multi-axis goniometry (PRIGo) |
| 2012-06-13 10:40:30 |
Detector: Details |
the new detector is a 2M-F model |
|
| 2012-06-13 10:40:21 |
Detector: Model |
DECTRIS PILATUS 2M |
DECTRIS PILATUS 2M-F |
| 2012-06-09 08:30:18 |
Removed from Service: Details |
|
replaced by a PILATUS 2M-F |
| 2012-06-09 08:29:59 |
Detector: Removed from Service |
|
2011-10-31 |
| 2011-04-25 11:00:42 |
Secondary Contact: Email |
clemens.schulze@psi.ch |
vincent.olieric@psi.ch |
| 2011-04-25 11:00:30 |
Secondary Contact: Name |
Clemens Schulze-Briese |
Vincent Olieric |
| 2011-04-25 10:59:54 |
Beamline Website |
http://sls.web.psi.ch/view.php/beamlines/px3/index.html |
http://www.psi.ch/sls/pxiii/pxiii |
| 2009-07-31 01:26:00 |
Special Capabilities Details |
|
Automated in-situ diffraction screening with crystals in various format of crystallization plates |
| 2009-07-31 01:24:07 |
Special Capabilities |
Microfocus |
In-situ diffraction screening |
