| 2023-08-11 10:43:20 |
Removed from Service: Details |
|
Currently in use |
| 2023-08-11 10:43:13 |
Detector: Removed from Service |
2017-06-01 |
2032-10-01 |
| 2023-08-11 10:42:22 |
Detector: Removed from Service |
2017-06-01 |
2022-10-01 |
| 2023-08-11 10:30:16 |
Removed from Service: Details |
|
|
| 2023-08-11 10:27:12 |
Detector: Activated for Service |
2010-11-11 |
2022-10-01 |
| 2023-08-11 10:26:54 |
Detector: Model |
DECTRIS PILATUS 6M |
DECTRIS EIGER 16M |
| 2023-08-11 10:26:28 |
Detector: Removed from Service |
2010-02-22 |
2017-06-01 |
| 2023-08-11 10:26:17 |
Detector: Activated for Service |
2009-10-30 |
2010-11-11 |
| 2023-08-11 10:25:47 |
Detector: Model |
ADSC Quantum 315r |
DECTRIS PILATUS 6M |
| 2023-08-11 10:25:38 |
Detector: Type |
CCD |
PIXEL |
| 2023-08-11 10:24:45 |
Detector: Type |
PIXEL |
CCD |
| 2023-08-11 10:24:25 |
Detector: Type |
CCD |
PIXEL |
| 2023-08-11 10:23:40 |
Detector: Type |
PIXEL |
CCD |
| 2023-08-11 10:22:35 |
Removed from Service: Details |
|
|
| 2020-02-12 06:06:08 |
Secondary Contact: Email |
ana@slac.stanford.edu |
soltis@slac.stanford.edu |
| 2020-02-12 06:06:02 |
Secondary Contact: Name |
Ana Gonzalez |
Mike Soltis |
| 2020-02-12 06:05:53 |
Primary Contact: Email |
soltis@slac.stanford.edu |
acohen@slac.stanford.edu |
| 2020-02-12 06:05:36 |
Primary Contact: Name |
Michael Soltis |
Aina Cohen |
| 2016-11-14 09:34:55 |
Detector: Removed from Service |
2009-10-30 |
2010-10-30 |
| 2016-11-14 09:03:33 |
Detector: Removed from Service |
2010-11-11 |
2009-10-30 |
| 2016-11-14 08:01:04 |
Detector: Removed from Service |
2010-11-11 |
2017-6-1 |
| 2016-11-14 07:56:47 |
Detector: Model |
MARmosaic 325 |
DECTRIS PILATUS 6M |
| 2016-11-14 07:56:38 |
Detector: Type |
CCD |
PIXEL |
| 2016-11-14 07:56:23 |
Detector: Model |
DECTRIS PILATUS 6M |
Rayonix MAR325 |
| 2016-11-14 07:56:00 |
Detector: Type |
PIXEL |
CCD |
| 2016-11-14 07:51:01 |
Detector: Activated for Service |
2010-11-11info currently not available |
2010-11-11 |
| 2014-09-30 10:46:46 |
Special Capabilities |
Absorption Edges |
Absorption Edges, Adjustable Focus Mirrors, Automatic Crystal Alignment, Automated Sample Screening, High Intensity, High Resolution, High Throughput, Micro-diffraction, Microfocus |
| 2014-09-30 10:43:40 |
Services |
High quality data collection, High speed data collection, Processing, Rapid access, Structure refinement, Structure solution, On-site crystallization faciility |
High quality data collection, High speed data collection, Processing, Rapid access, Structure refinement, Structure solution, On-site crystallization facility |
| 2014-09-30 10:43:03 |
Services |
High quality data collection, High speed data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
High quality data collection, High speed data collection, Processing, Rapid access, Structure refinement, Structure solution, On-site crystallization faciility |
| 2014-09-30 10:41:11 |
Special Capabilities |
Absorption Edges, Automatic Crystal Alignment, Automated Sample Screening, High Resolution, High Throughput, Microspectrophotometer |
Absorption Edges |
| 2014-09-30 08:09:49 |
Robotics: More Info |
|
See http://smb.slac.stanford.edu/users_guide/ |
| 2014-09-30 08:09:36 |
Robotics: More Info |
14-18 mm pin length |
|
| 2014-09-30 08:07:47 |
Goniometer Details |
Air bearing; coaxial cold stream; I.5 micron SOC |
Air bearing; coaxial cold stream; 1.5 micron SOC |
| 2014-09-30 08:07:35 |
Energy Range (keV): Max |
17.2 |
17.0 |
| 2014-09-30 08:07:27 |
Energy Range (keV): Min |
6.67 |
6.69 |
| 2014-09-30 08:07:19 |
Wavelength (Å): Max |
1.86 |
1.85 |
| 2014-09-30 08:07:09 |
Wavelength (Å): Min |
0.72 |
0.73 |
| 2014-09-30 08:04:30 |
Owner/Operator |
SSRL-SMB-MC; Caltech |
SSRL-SMB-MC; Caltech; Genentech |
| 2014-09-30 04:33:42 |
Services |
High quality data collection, High speed data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
High quality data collection, High speed data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
| 2014-09-30 04:06:38 |
Detector: Activated for Service |
2010-11-11 |
2010-02-24 |
| 2014-09-30 04:05:50 |
Detector: Removed from Service |
2010-11-11 |
2010-02-22 |
| 2014-09-30 04:04:51 |
Detector: Activated for Service |
info currently not available |
2010-11-11 |
| 2014-09-30 04:04:22 |
Detector: Activated for Service |
2011-10-30 |
2009-10-30 |
| 2014-09-30 04:04:09 |
Detector: Removed from Service |
|
2010-11-11 |
| 2014-09-30 03:51:46 |
Mirrors |
Rh coated collimating mirrors, K-B mirrors |
Rh coated collimating mirrors, K-B focusing mirrors |
| 2014-09-30 03:51:18 |
Optics Details |
K-B focusing mirrors |
|
| 2014-09-30 03:51:10 |
Mirrors |
Rh coated |
Rh coated collimating mirrors, K-B mirrors |
| 2014-09-30 03:50:41 |
Monochromator |
Liquid nitrogen-cooled double crystal |
Liquid nitrogen-cooled double crystal, non fixed exit slit |
| 2014-09-30 02:38:35 |
Special Capabilities Details |
Microbeam sizes (FWHM): 10, 20 um diameter |
Full remote access. Microbeam sizes (FWHM): 10, 20 um diameter |
| 2014-09-30 02:37:57 |
Services |
|
High quality data collection, High speed data collection, On-site cyrstallization facility, Processing, Rapid access, Structure refinement, Structure solution |
| 2014-09-30 02:36:58 |
Special Capabilities |
Absorption Edges, Adjustable Focus Mirrors, Automatic Crystal Alignment, Automated Sample Screening, High Intensity, High Resolution, High Throughput, Micro-diffraction, Microfocus |
Absorption Edges, Automatic Crystal Alignment, Automated Sample Screening, High Resolution, High Throughput, Microspectrophotometer |
| 2014-09-25 04:30:46 |
Special Capabilities Details |
Microbeam sizes (FWHM): 7, 10, 20 um diameter |
Microbeam sizes (FWHM): 10, 20 um diameter |
| 2013-12-03 03:20:44 |
Spot Size (mm): Width |
0.01 - 0.10 |
0.05 - 0.10 |
| 2013-12-03 03:20:32 |
Spot Size (mm): Height |
0.01 - 0.2 |
0.015 - 0.2 |
| 2013-07-17 07:40:19 |
Flux Details |
Full beam at 12.6 keV, 350 mA |
Full beam at 12.6 keV, 500 mA |
| 2013-07-17 07:40:06 |
Flux Coefficient |
2 |
4.0 |
| 2013-07-17 07:39:51 |
Spot Size (mm): Width |
0.050 - 0.150 |
0.01 - 0.10 |
| 2013-07-17 07:39:39 |
Spot Size (mm): Height |
0.015 - 0.150 |
0.01 - 0.2 |
| 2012-03-19 05:31:39 |
Goniometer Details |
Air bearing; coaxial cold stream; I.5 micron sphere of confusion |
Air bearing; coaxial cold stream; I.5 micron SOC |
| 2012-03-19 05:31:26 |
Goniometer Details |
Air bearing; coaxial cold stream; I.5 micron sphere of confusion |
Air bearing; coaxial cold stream; I.5 micron sphere of confusion |
| 2012-03-19 05:31:20 |
Goniometer Details |
Air bearing; coaxial cols stream; I.5 micron sphere of confusion |
Air bearing; coaxial cold stream; I.5 micron sphere of confusion |
| 2012-03-19 05:31:11 |
Goniometer Details |
Air bearing; coaxial cols stream; I.5 um sphere of confusion |
Air bearing; coaxial cols stream; I.5 micron sphere of confusion |
| 2012-03-19 05:30:52 |
Goniometer Details |
I.5 um sphere of confusion |
Air bearing; coaxial cols stream; I.5 um sphere of confusion |
| 2012-03-19 05:30:14 |
Goniometer Details |
|
I.5 um sphere of confusion |
| 2012-03-19 05:29:51 |
Goniometer |
SSRL microdiffractometer |
SSRL single-axis microdiffractometer |
| 2012-03-19 05:29:33 |
Goniometer |
single axis diffractometer |
SSRL microdiffractometer |
| 2012-03-19 05:29:06 |
Goniometer |
single axis diffractometer |
single axis diffractometer |
| 2012-03-19 05:27:37 |
Spot Size (mm): Width |
0.015 - 0.150 |
0.050 - 0.150 |
| 2012-03-19 05:27:31 |
Spot Size (mm): Height |
0.050 - 0.150 |
0.015 - 0.150 |
| 2012-03-19 05:27:11 |
Special Capabilities Details |
Microbeam size (FWHM): 7, 10, 20 um diameter |
Microbeam sizes (FWHM): 7, 10, 20 um diameter |
| 2012-03-19 05:26:56 |
Flux Details |
Full beam at 12.6 keV, 350 mA (Flux = 2e11 for 10 um microbeam) |
Full beam at 12.6 keV, 350 mA |
| 2012-03-19 05:26:42 |
Flux Details |
Full beam at 12.6 keV, 350 mA (Flux = 2e11 in 10 um microbeam) |
Full beam at 12.6 keV, 350 mA (Flux = 2e11 for 10 um microbeam) |
| 2012-03-19 05:26:28 |
Flux Details |
Full beam at 12.6 keV, 350 mA (Flux = 2e11 in 10 um x 10 um microbeam) |
Full beam at 12.6 keV, 350 mA (Flux = 2e11 in 10 um microbeam) |
| 2012-03-19 05:25:24 |
Special Capabilities Details |
Microbeam FWHM: 7, 10, 20 um diameter |
Microbeam size (FWHM): 7, 10, 20 um diameter |
| 2012-03-19 05:25:10 |
Special Capabilities Details |
Microbeam FWHM: 7, 10, 20 micron diameter |
Microbeam FWHM: 7, 10, 20 um diameter |
| 2012-03-19 05:24:56 |
Special Capabilities Details |
Microbeam sizes: 7, 10, 20 micron diameter |
Microbeam FWHM: 7, 10, 20 micron diameter |
| 2012-03-19 05:24:29 |
Special Capabilities Details |
Microbeam sizes: 7 x 7, 10 x 10, 20 x 20 (um x um) |
Microbeam sizes: 7, 10, 20 micron diameter |
| 2012-03-19 05:22:47 |
Flux Details |
Full beam at 12.6 keV, 350 mA (2e11 in 10 um x 10 um microbeam) |
Full beam at 12.6 keV, 350 mA (Flux = 2e11 in 10 um x 10 um microbeam) |
| 2012-03-19 05:22:33 |
Flux Details |
Full beam at 12.6 keV, 350 mA (1e11 in 10 um x 10 um microbeam) |
Full beam at 12.6 keV, 350 mA (2e11 in 10 um x 10 um microbeam) |
| 2012-03-19 05:21:55 |
Flux Details |
Full beam at 12.6 keV, 350 mA |
Full beam at 12.6 keV, 350 mA (1e11 in 10 um x 10 um microbeam) |
| 2012-03-19 05:15:52 |
Special Capabilities Details |
Microbeam sizes: 7x7, 10x10, 20x20 (umxum) |
Microbeam sizes: 7 x 7, 10 x 10, 20 x 20 (um x um) |
| 2012-03-19 05:02:41 |
Special Capabilities |
Microcrystal |
Absorption Edges, Adjustable Focus Mirrors, Automatic Crystal Alignment, Automated Sample Screening, High Intensity, High Resolution, High Throughput, Micro-diffraction, Microfocus |
| 2012-03-19 05:02:04 |
Special Capabilities |
Absorption Edges, Adjustable Focus Mirrors, Automatic Crystal Alignment, Automated Sample Screening, High Intensity, High Resolution, High Throughput, Micro-diffraction, Microfocus |
Microcrystal |
| 2012-03-19 05:01:13 |
Special Capabilities |
Absorption Edges, Adjustable Focus Mirrors, Automatic Crystal Alignment, Automated Sample Screening, High Intensity |
Absorption Edges, Adjustable Focus Mirrors, Automatic Crystal Alignment, Automated Sample Screening, High Intensity, High Resolution, High Throughput, Micro-diffraction, Microfocus |
| 2012-03-19 05:00:35 |
Special Capabilities |
Absorption Edges |
Absorption Edges, Adjustable Focus Mirrors, Automatic Crystal Alignment, Automated Sample Screening, High Intensity |
| 2012-03-19 04:59:47 |
Special Capabilities |
Microfocus; Automated sample screening; Remote Access, microcrystal |
Absorption Edges |
| 2012-03-19 04:59:08 |
Experiments |
MAD |
MAD, SAD, MONOCHROMATIC |
| 2012-03-19 04:58:35 |
Status Details |
Operational |
|
| 2012-03-19 04:58:29 |
Status Details |
Operational |
Operational |
| 2012-03-19 04:58:26 |
Status |
Commissioning |
Operational |
| 2012-03-19 04:58:18 |
Status Details |
operational 50% of the time during commissioning |
Operational |
| 2012-03-19 04:57:12 |
Detector: Type |
PIXEL |
CCD |
| 2012-03-19 04:56:24 |
Detector: Details |
Shutterless data collection; Fine phi slicing |
Shutterless data collection; Fine phi slicing experiments |
| 2012-03-19 04:56:11 |
Detector: Details |
|
Shutterless data collection; Fine phi slicing |
| 2012-03-19 04:55:08 |
Spot Size (mm): Width |
0.015 - 0.200 |
0.015 - 0.150 |
| 2012-03-19 04:54:57 |
Spot Size (mm): Width |
0.015 - 0.150 |
0.015 - 0.200 |
| 2012-03-19 04:54:27 |
Spot Size (mm): Height |
0.05 - 0.150 |
0.050 - 0.150 |
| 2012-03-19 04:54:21 |
Spot Size (mm): Width |
0.015 - 0.15 |
0.015 - 0.150 |
| 2012-03-19 04:54:14 |
Spot Size (mm): Width |
0.015 |
0.015 - 0.15 |
| 2012-03-19 04:54:05 |
Spot Size (mm): Height |
0.05 |
0.05 - 0.150 |
| 2012-03-19 04:53:22 |
Special Capabilities Details |
Microbeam sizes: 7x7, 10x10, 20x20 (umxum) |
Microbeam sizes: 7x7, 10x10, 20x20 (umxum) |
| 2012-03-19 04:52:24 |
Optics Details |
KB focuding mirrors |
K-B focusing mirrors |
| 2012-03-19 04:52:15 |
Optics Details |
|
KB focuding mirrors |
| 2012-03-19 04:51:20 |
Source Type |
insertion device |
INSERTION DEVICE |
| 2012-03-19 04:49:22 |
Flux Details |
Full focused beam at 12.6 keV, 350 mA |
Full beam at 12.6 keV, 350 mA |
| 2012-03-19 04:48:37 |
Special Capabilities Details |
Microbeam sizes 7x7, 10x10, 20x20 |
Microbeam sizes: 7x7, 10x10, 20x20 (umxum) |
| 2012-03-19 04:47:39 |
Special Capabilities Details |
Beam sizes 7, 10, 20, 50-100 |
Microbeam sizes 7x7, 10x10, 20x20 |
| 2012-03-19 04:46:12 |
Special Capabilities Details |
Beam size 7, 10, 20, 50-100 |
Beam sizes 7, 10, 20, 50-100 |
| 2012-03-19 04:46:07 |
Special Capabilities Details |
|
Beam size 7, 10, 20, 50-100 |
| 2012-03-19 04:44:49 |
Flux Details |
Full focused beam at 12 keV, 350 mA |
Full focused beam at 12.6 keV, 350 mA |
| 2012-03-19 04:44:37 |
Flux Details |
Full focused beam at 12 keV |
Full focused beam at 12 keV, 350 mA |
| 2012-03-19 04:44:27 |
Flux Details |
90 mA at 12 keV. |
Full focused beam at 12 keV |
| 2012-03-19 04:43:59 |
Spot Size (mm): Width |
0.02 |
0.015 |
| 2012-03-19 04:43:53 |
Spot Size (mm): Height |
0.07 |
0.05 |
| 2012-03-19 04:43:08 |
Flux Exponent |
11 |
12 |
| 2012-03-19 04:43:03 |
Flux Coefficient |
8 |
2 |
| 2012-03-19 04:41:58 |
Owner/Operator |
Caltech; SSRL-SMB-MC |
SSRL-SMB-MC; Caltech |
| 2011-11-14 10:37:10 |
Status |
Operational |
Commissioning |
| 2011-11-14 10:34:32 |
Status |
commissioning |
Operational |
| 2010-03-26 05:24:26 |
Detector: Model |
Pilatus 6M |
DECTRIS PILATUS 6M |
| 2010-03-26 05:24:21 |
Detector: Type |
CCD |
PIXEL |
| 2010-03-26 05:22:44 |
Detector: Activated for Service |
|
2010-02-24 |
| 2010-03-26 05:22:03 |
Detector: Model |
MARMOSAIC 325 |
Pilatus 6M |
| 2009-08-19 10:00:23 |
%Time Available (general use) |
60% of available time - |
60% |
| 2009-08-19 10:00:18 |
Status Details |
|
operational 50% of the time during commissioning |
| 2009-08-19 10:00:15 |
%Time Available (general use) |
60% of available time - operational 50% of the time during commissioning |
60% of available time - |
| 2009-08-19 09:59:58 |
%Time Available (general use) |
60% |
60% of available time - operational 50% of the time during commissioning |
